DESIGN FOR TESTABILITY FOR COMPLETE TEST COVERAGE

被引：5
|
作者：
MOTOHARA, A
FUJIWARA, H
机构：
来源：
IEEE DESIGN & TEST OF COMPUTERS | 1984年 / 1卷 / 04期
关键词：
D O I：
10.1109/MDT.1984.5005686
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
引用
收藏
页码：25 / 32
页数：8
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