DESIGN FOR TESTABILITY FOR COMPLETE TEST COVERAGE

被引：5

作者：

MOTOHARA, A

FUJIWARA, H

机构：

来源：

IEEE DESIGN & TEST OF COMPUTERS | 1984年 / 1卷 / 04期

关键词：

D O I：

10.1109/MDT.1984.5005686

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

引用

页码：25 / 32

页数：8

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