ON THE MEASUREMENT OF DENSITIES OF STATES IN AMORPHOUS-SEMICONDUCTORS

被引：14
|
作者：
HALPERN, V
机构：
来源：
PHILOSOPHICAL MAGAZINE B-PHYSICS OF CONDENSED MATTER STATISTICAL MECHANICS ELECTRONIC OPTICAL AND MAGNETIC PROPERTIES | 1984年 / 49卷 / 05期
关键词：
D O I：
10.1080/13642818408227652
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：L57 / L59
页数：3
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