JOINT SPECIAL ISSUE ON ANALOG AND MIXED-SIGNAL TESTING - INTRODUCTION

被引:0
|
作者
SOMA, M
机构
关键词
D O I
10.1007/BF01239073
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
引用
收藏
页码:197 / 198
页数:2
相关论文
共 50 条
  • [11] Special issue on analog and mixed signal testing
    Kaminska, B
    Courtois, B
    [J]. JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 1996, 9 (1-2): : 7 - 8
  • [12] Tutorial introduction to research on analog and mixed-signal circuit testing
    Milor, Linda S.
    [J]. IEEE Transactions on Circuits and Systems II: Analog and Digital Signal Processing, 1998, 45 (10): : 1389 - 1407
  • [13] A tutorial introduction to research on analog and mixed-signal circuit testing
    Milor, LS
    [J]. IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS, 1998, 45 (10) : 1389 - 1407
  • [14] Introduction to the Special issue on Digital and Mixed-Signal Circuits and Systems
    Sawan, Mohamad
    Boukadoum, Mounir
    [J]. MICROELECTRONICS JOURNAL, 2009, 40 (11) : 1569 - 1570
  • [15] Analog and mixed-signal IP cores testing
    Wong, MWT
    Ko, KY
    Lee, YS
    [J]. FIRST IEEE INTERNATION WORKSHOP ON ELECTRONIC DESIGN, TEST AND APPLICATIONS, PROCEEDINGS, 2002, : 3 - 7
  • [16] Benchmark circuits for analog and mixed-signal testing
    Kondagunturi, R
    Bradley, E
    Maggard, K
    Stroud, C
    [J]. IEEE SOUTHEASTCON '99, PROCEEDINGS, 1999, : 217 - 220
  • [17] Defect Oriented Testing for Analog/Mixed-Signal Designs
    Kruseman, Bram
    Tasic, Bratislav
    Hora, Camelia
    Dohmen, Jos
    Hashempour, Hamidreza
    van Beurden, Maikel
    Xing, Yizi
    [J]. IEEE DESIGN & TEST OF COMPUTERS, 2012, 29 (05): : 72 - 80
  • [18] Recent advances in analog, mixed-signal, and RF testing
    Cheng K.-T.
    Chang H.-M.
    [J]. IPSJ Transactions on System LSI Design Methodology, 2010, 3 : 19 - 46
  • [19] Guest Editorial: Analog, Mixed-Signal and RF Testing
    Gildas Léger
    Carsten Wegener
    [J]. Journal of Electronic Testing, 2016, 32 : 405 - 406
  • [20] Guest Editorial: Analog, Mixed-Signal and RF Testing
    Barragan, Manuel J.
    Eisenstadt, William R.
    [J]. JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2017, 33 (03): : 281 - 282