RESPONSE ERRORS OF IMPULSE TEST CIRCUITS

被引：0
|
作者：
HYLTENCAVALLIUS, N
CHAGAS, FA
DASILVA, MA
机构：
来源：
IEEE TRANSACTIONS ON POWER APPARATUS AND SYSTEMS | 1984年 / 103卷 / 11期
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暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
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页码：3277 / 3285
页数：9
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