RESPONSE ERRORS OF IMPULSE TEST CIRCUITS

被引：0

作者：

HYLTENCAVALLIUS, N

CHAGAS, FA

DASILVA, MA

机构：

来源：

IEEE TRANSACTIONS ON POWER APPARATUS AND SYSTEMS | 1984年 / 103卷 / 11期

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：3277 / 3285

页数：9

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