DIRECTION OF ELECTROMIGRATION IN GOLD THIN-FILMS

被引：13
|
作者：
BLECH, IA
ROSENBERG, R
机构：
[1] TECHNION ISRAEL INST TECHNOL,HAIFA,ISRAEL
[2] IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
来源：
JOURNAL OF APPLIED PHYSICS | 1975年 / 46卷 / 02期
关键词：
D O I：
10.1063/1.321662
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
引用
收藏
页码：579 / 583
页数：5
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