Radiation effects on scientific CMOS image sensor

被引：0
|
作者：
Zhao, Yuanfu [1 ]
Liu, Liyan [1 ]
Liu, Xiaohui [1 ]
Jin, Xiaofeng [1 ]
Li Xiang [1 ]
机构：
[1] Beijing Microelect Technol Inst, Beijing 100076, Peoples R China
来源：
JOURNAL OF SEMICONDUCTORS | 2015年 / 36卷 / 11期
关键词：
CMOS image sensor (APS); dark current; dark signal response non-uniformity; total dose effects; single event effects;
D O I：
10.1088/1674-4926/36/11/114007
中图分类号：
O469 [凝聚态物理学];
学科分类号：
070205 ;
摘要：
systemic solution for radiation hardened design is presented. Besides, a series of experiments have been carried out on the samples, and then the photoelectric response characteristic and spectral characteristic before and after the experiments have been comprehensively analyzed. The performance of the CMOS image sensor with the radiation hardened design technique realized total-dose resilience up to 300 krad(Si) and resilience to single-event latch up for LET up to110 MeV center dot cm(2)/mg.
引用
收藏
页数：5
相关论文
共 50 条
  • [41] Generic Radiation Hardened Photodiode Layouts for Deep Submicron CMOS Image Sensor Processes
    Goiffon, V.
    Cervantes, P.
    Virmontois, C.
    Corbiere, F.
    Magnan, P.
    Estribeau, M.
    IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2011, 58 (06) : 3076 - 3084
  • [42] Methods for Predicting Dark-Current Distribution of CMOS Image Sensor in Radiation Environment
    Zheng, Ran
    Hui, Xiangli
    Wang, Jia
    Zhao, Ruiguang
    Wei, Xiaomin
    Hu, Yongcai
    2016 IEEE INTERNATIONAL CONFERENCE ON SIGNAL PROCESSING, COMMUNICATIONS AND COMPUTING (ICSPCC), 2016,
  • [43] A Portable Dosimetric System Based on a CMOS Image Sensor for Radiation Protection in Interventional Radiology
    Conti, E.
    Placidi, P.
    Magalotti, D.
    Bissi, L.
    Paolucci, M.
    Scorzoni, A.
    Servoli, L.
    2014 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE (I2MTC) PROCEEDINGS, 2014, : 288 - 292
  • [44] Prediction of CMOS Image Sensor Dark Current Distribution and Noise in a Space Radiation Environment
    Martin, Emma
    Gilard, Olivier
    Nuns, Thierry
    David, Jean-Pierre
    Virmontois, Cedric
    IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2013, 60 (03) : 2280 - 2287
  • [45] CCD or CMOS Image Sensor For Photography
    Mehta, Sanket
    Patel, Arpita
    Mehta, Jagrat
    2015 INTERNATIONAL CONFERENCE ON COMMUNICATIONS AND SIGNAL PROCESSING (ICCSP), 2015, : 291 - 294
  • [46] CMOS RADIATION SENSOR WITH BINARY OUTPUT
    MORENO, EG
    INIGUEZ, B
    ROCA, M
    SEGURA, J
    SUREDA, S
    IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1995, 42 (03) : 174 - 178
  • [47] A 3 THz CMOS Image Sensor
    Liu, Min
    Cai, Ziteng
    Wang, Zhe
    Zhou, Shaohua
    Law, Man-Kay
    Liu, Jian
    Ma, Jianguo
    Wu, Nanjian
    Liu, Liyuan
    IEEE JOURNAL OF SOLID-STATE CIRCUITS, 2024, 59 (09) : 2934 - 2947
  • [48] CMOS Image Sensor with Contour Enhancement
    Meng, Liya
    Lai, Xiaofeng
    Chen, Kun
    Yuan, Xianghui
    5TH INTERNATIONAL SYMPOSIUM ON ADVANCED OPTICAL MANUFACTURING AND TESTING TECHNOLOGIES: OPTOELECTRONIC MATERIALS AND DEVICES FOR DETECTOR, IMAGER, DISPLAY, AND ENERGY CONVERSION TECHNOLOGY, 2010, 7658
  • [49] Stereoscopic image sensor in CMOS technology
    Carmo, J. P.
    Silva, M. F.
    Rocha, R. P.
    Ribeiro, J. F.
    Goncalves, L. M.
    Correia, J. H.
    EUROSENSORS XXV, 2011, 25
  • [50] Coronene enhanced CMOS image sensor
    Luo, Lei
    Song, Li-Yuan
    Tang, Li-Bin
    Wang, Shan-Li
    Cai, Yu-Hua
    Li, Jun-Bin
    JOURNAL OF INFRARED AND MILLIMETER WAVES, 2023, 42 (06) : 932 - 937
12345