SCANNING TUNNELING MICROSCOPY OF NANOCRYSTALLINE SILICON SURFACES

被引：22

作者：

GIMZEWSKI, JK ^{[1
]}

HUMBERT, A ^{[1
]}

POHL, DW ^{[1
]}

VEPREK, S ^{[1
]}

机构：

[1] INST INORGAN CHEM,CH-8057 ZURICH,SWITZERLAND

来源：

SURFACE SCIENCE | 1986年 / 168卷 / 1-3期

关键词：

D O I：

10.1016/0039-6028(86)90911-8

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：795 / 800

页数：6

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