SCANNING TUNNELING MICROSCOPY OF NANOCRYSTALLINE SILICON SURFACES

被引：22
|
作者：
GIMZEWSKI, JK [1 ]
HUMBERT, A [1 ]
POHL, DW [1 ]
VEPREK, S [1 ]
机构：
[1] INST INORGAN CHEM,CH-8057 ZURICH,SWITZERLAND
来源：
SURFACE SCIENCE | 1986年 / 168卷 / 1-3期
关键词：
D O I：
10.1016/0039-6028(86)90911-8
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
引用
收藏
页码：795 / 800
页数：6
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