COMPLETE ELIMINATION OF SPECULAR REFLECTANCE IN INFRARED DIFFUSE REFLECTANCE MEASUREMENTS

被引：48
|
作者：
MESSERSCHMIDT, RG
机构：
来源：
APPLIED SPECTROSCOPY | 1985年 / 39卷 / 04期
关键词：
D O I：
10.1366/0003702854250167
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
引用
收藏
页码：737 / 739
页数：3
相关论文
共 50 条
  • [31] DETERMINATION OF SURFACE ROUGHNESS FROM MEASUREMENTS OF SPECULAR REFLECTANCE
    BENNETT, HE
    PORTEUS, JO
    JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1960, 50 (05) : 504 - 505
  • [32] THE GLOSS TRAP IN DIFFUSE REFLECTANCE MEASUREMENTS
    BUDDE, W
    COLOR RESEARCH AND APPLICATION, 1980, 5 (02): : 73 - 75
  • [33] PROCEDURES AND STANDARDS FOR ACCURATE SPECTROPHOTOMETRIC MEASUREMENTS OF SPECULAR REFLECTANCE
    ZWINKELS, JC
    NOEL, M
    DODD, CX
    APPLIED OPTICS, 1994, 33 (34) : 7933 - 7944
  • [34] SPECULAR UV REFLECTANCE MEASUREMENTS FOR CAVITY RADIOMETER DESIGN
    BOOKER, RL
    APPLIED OPTICS, 1982, 21 (01): : 153 - 157
  • [35] SPECULAR REFLECTANCE OF MIRRORS
    REVIE, RW
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1977, 124 (08) : 1303 - 1304
  • [36] High-accuracy measurements of the normal specular reflectance
    Voarino, Philippe
    Piombini, Herve
    Sabary, Frederic
    Marteau, Daniel
    Dubard, Jimmy
    Hameury, Jacques
    Filtz, Jean Remy
    APPLIED OPTICS, 2008, 47 (13) : C303 - C309
  • [37] DIFFUSE REFLECTANCE MEASUREMENTS USING FOURIER-TRANSFORM INFRARED (FTIR) SPECTROSCOPY
    WITEK, H
    KRISHNAN, K
    HILL, SL
    MATSUMOTO, H
    PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS, 1981, 289 : 108 - 110
  • [38] STANDARD OF SPECULAR REFLECTANCE AT NEAR NORMAL INCIDENCE FOR THE INFRARED REGION
    GUPTA, D
    VARMA, SP
    APPLIED OPTICS, 1990, 29 (13): : 1872 - 1874
  • [39] Development of a new integrating sphere with uniform reflectance for absolute diffuse reflectance measurements
    Shitomi, H
    Mishima, Y
    Saito, I
    METROLOGIA, 2003, 40 (01) : S185 - S188
  • [40] Infrared diffuse reflectance instrumentation and standards at NIST
    Hanssen, LM
    Kaplan, S
    ANALYTICA CHIMICA ACTA, 1999, 380 (2-3) : 289 - 302
12345