Fractional Quantum Hall Effect in SiGe/Si/SiGe Quantum Wells in Weak Quantizing Magnetic Fields

被引:0
|
作者
V. T. Dolgopolov
M. Yu. Melnikov
A. A. Shashkin
S.-H. Huang
C. W. Liu
S. V. Kravchenko
机构
[1] Russian Academy of Sciences,Institute of Solid State Physics
[2] National Taiwan University,Department of Electrical Engineering and Graduate Institute of Electronics Engineering
[3] National Nano Device Laboratories,Physics Department
[4] Northeastern University,undefined
来源
JETP Letters | 2018年 / 107卷
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摘要
We have experimentally studied the fractional quantum Hall effect in SiGe/Si/SiGe quantum wells in relatively weak magnetic fields, where the Coulomb interaction between electrons exceeds the cyclotron splitting by a factor of a few XX. Minima of the longitudinal resistance have been observed corresponding to the quantum Hall effect of composite fermions with quantum numbers p = 1, 2, 3, and 4. Minima with p = 3 disappear in magnetic fields below 7 T, which may be a consequence of the intersection or even merging of the quantum levels of the composite fermions with different orientations of the pseudo-spin, i.e., those belonging to different valleys. We have also observed minima of the longitudinal resistance at filling factors ν = 4/5 and 4/11, which may be due to the formation of the second generation of the composite fermions.
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页码:794 / 797
页数:3
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