Effect of spontaneous polarization change on current-voltage characteristics of thin ferroelectric films

被引:0
|
作者
Yu. V. Podgorny
P. P. Lavrov
K. A. Vorotilov
A. S. Sigov
机构
[1] Moscow State Technical University of Radio-Engineering,
[2] Electronics and Automation,undefined
来源
关键词
Coercive Field; Spontaneous Polarization; Voltage Characteristic; Thin Ferroelectric Film; Ferroelectric Film;
D O I
暂无
中图分类号
学科分类号
摘要
The role of a change in the spontaneous polarization charge in the formation of negative differential conductance regions of the current-voltage characteristics of thin ferroelectric films has been determined. It has been shown that the polarization recovery current, which appears due to partial depolarization of a preliminarily polarized film, prevails over the intrinsic leakage current of the ferroelectric film in the coercive field region and corresponds to the Weibull distribution. The influence of polarization recovery current decreases with decreasing voltage sweep rate.
引用
收藏
页码:476 / 479
页数:3
相关论文
共 50 条
  • [41] Capacitance-voltage and current-voltage characteristics of graphite oxide thin films patterned by ultraviolet photolithography
    Lee, In-yeal
    Kannan, E. S.
    Kim, Gil-Ho
    APPLIED PHYSICS LETTERS, 2009, 95 (26)
  • [42] CURRENT-VOLTAGE NONLINEAR CHARACTERISTICS OF THIN METAL WIRE
    KANER, EA
    SNAPIRO, IB
    YAMPOLSKII, VA
    FIZIKA NIZKIKH TEMPERATUR, 1985, 11 (05): : 477 - 482
  • [43] Phase Transition Behaviours of the Spontaneous Polarization in Ferroelectric Thin Films
    Rong, Li
    PROCEEDINGS OF THE 2015 INTERNATIONAL CONFERENCE ON MECHATRONICS, ELECTRONIC, INDUSTRIAL AND CONTROL ENGINEERING, 2015, 8 : 54 - 57
  • [45] Studying the Current-Voltage Characteristics of Liquid-Crystal Langmuir Films in the Region of the Ferroelectric Phase Transition
    Levshin, N. L.
    Forsh, P. A.
    Khlybov, S. V.
    Yudin, S. G.
    JOURNAL OF SURFACE INVESTIGATION, 2013, 7 (04): : 734 - 736
  • [46] Nonlinear current-voltage characteristics of the cross-shaped microstructures based on thin bismuth films
    Il'in, AI
    Aparshina, AI
    Dubonos, SV
    Tolkunov, BN
    TECHNICAL PHYSICS LETTERS, 2000, 26 (05) : 439 - 442
  • [47] Morphology and current-voltage characteristics of nanostructured pentacene thin films probed by atomic force microscopy
    Zorba, S
    Le, QT
    Watkins, NJ
    Yan, L
    Gao, YL
    JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, 2001, 1 (03) : 317 - 321
  • [48] Current-voltage characteristics of layer-by-layer self-assembled colloidal thin films
    Jafri, S. H. M.
    Dutta, J.
    Sweatman, D.
    Sharma, A. B.
    APPLIED PHYSICS LETTERS, 2006, 89 (13)
  • [49] Nonlinear current-voltage characteristics of the cross-shaped microstructures based on thin bismuth films
    A. I. Il’in
    A. I. Aparshina
    S. V. Dubonos
    B. N. Tolkunov
    Technical Physics Letters, 2000, 26 : 439 - 442
  • [50] Electric-field-induced current-voltage characteristics in electronic conducting perovskite thin films
    Rupp, Jennifer L. M.
    Reinhard, Patrick
    Pergolesi, Daniele
    Ryll, Thomas
    Toelke, Rene
    Traversa, Enrico
    APPLIED PHYSICS LETTERS, 2012, 100 (01)