A test-retest dataset for assessing long-term reliability of brain morphology and resting-state brain activity

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作者
Lijie Huang
Taicheng Huang
Zonglei Zhen
Jia Liu
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[1] State Key Laboratory of Cognitive Neuroscience and Learning & IDG/McGovern Institute for Brain Research,
[2] Beijing Normal University,undefined
[3] Beijing Key Laboratory of Applied Experimental Psychology,undefined
[4] School of Psychology,undefined
[5] Beijing Normal University,undefined
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摘要
We present a test-retest dataset for evaluation of long-term reliability of measures from structural and resting-state functional magnetic resonance imaging (sMRI and rfMRI) scans. The repeated scan dataset was collected from 61 healthy adults in two sessions using highly similar imaging parameters at an interval of 103–189 days. However, as the imaging parameters were not completely identical, the reliability estimated from this dataset shall reflect the lower bounds of the true reliability of sMRI/rfMRI measures. Furthermore, in conjunction with other test-retest datasets, our dataset may help explore the impact of different imaging parameters on reliability of sMRI/rfMRI measures, which is especially critical for assessing datasets collected from multiple centers. In addition, intelligence quotient (IQ) was measured for each participant using Raven’s Advanced Progressive Matrices. The data can thus be used for purposes other than assessing reliability of sMRI/rfMRI alone. For example, data from each single session could be used to associate structural and functional measures of the brain with the IQ metrics to explore brain-IQ association.
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