Structural and optical characterization of PLT thin films prepared by a sol-gel process

被引：0
|
作者：
Q.F. Zhou
H.L.W. Chan
C.L. Choy
机构：
[1] Department of Applied Physics and Materials Research Centre,
[2] The Hong Kong Polytechnic University,undefined
[3] Kowloon,undefined
[4] Hong Kong,undefined
[5] P.R. China,undefined
来源：
Applied Physics A | 2000年 / 70卷
关键词：
PACS: 78.20.-e; 78.30.-j; 81.20.Fw;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
Lanthanum-modified lead titanate (PLT) thin films were deposited on fused-quartz substrates using a sol-gel process. The crystallization behaviour and structural changes were studied as a function of the annealing temperature by differential thermal analysis, thermogravimetry, infrared spectroscopy, and X-ray diffraction. The surface morphology of the films was characterized in a scanning electron microscope. The absorption edge was found to shift to longer wavelength with increasing crystallite size.
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页码：293 / 296
页数：3
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