Acoustic phase velocity measurements with nanometer resolution by scanning acoustic force microscopy

被引：0
|
作者：
E. Chilla
T. Hesjedal
H.-J. Fröhlich
机构：
[1] Paul-Drude Institute for Solid State Electronics,
[2] Hausvogteiplatz 5–7,undefined
[3] D-10117 Berlin,undefined
[4] Germany (Fax: +49-30/20377-257,undefined
[5] E-mail: e.chilla@pdi-berlin.de),undefined
来源：
Applied Physics A | 1998年 / 66卷
关键词：
PACS: 61.16.Ch; 43.35.+d; 43.58.+z;
D O I：
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中图分类号：
学科分类号：
摘要：
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页码：S223 / S226
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