SCANNING ELECTRON ACOUSTIC MICROSCOPY

被引：0

作者：

DAVIES, G ^{[1
]}

HOWIE, A ^{[1
]}

STAVELEYSMITH, L ^{[1
]}

机构：

[1] UNIV CAMBRIDGE, CAVENDISH LAB, CAMBRIDGE CB3 0HE, ENGLAND

来源：

PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS | 1983年 / 368卷

关键词：

D O I：

暂无

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：58 / 65

页数：8

共 50 条

[1] SCANNING ELECTRON ACOUSTIC MICROSCOPY AND SCANNING ACOUSTIC MICROSCOPY - A FAVORABLE COMPARISON
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[J]. SCANNING ELECTRON MICROSCOPY, 1984, : 1041 - 1052
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[J]. INSTITUTE OF PHYSICS CONFERENCE SERIES, 1983, (68): : 467 - 470
[5] TECHNIQUES FOR SCANNING ELECTRON ACOUSTIC MICROSCOPY
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[J]. INSTITUTE OF PHYSICS CONFERENCE SERIES, 1983, (67): : 387 - 392
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