GaAs;
Active Region;
Magnetic Material;
Electromagnetism;
Barrier Layer;
D O I:
暂无
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摘要:
The design of the active region in InGaAsN quantum well (QW) injection lasers is investigated. Long-wavelength (1.27–1.3 mm), low-threshold (<400 A/cm2), and high-efficiency (>50%) lasing is obtained at room temperature from structures based on single InGaAsN QWs in GaAs or InGaAsN barrier layers. The principal parameters (threshold, temperature, power) of these lasers have been studied in the wide-stripe configuration. The characteristics of injection lasers with different designs of the active region are compared.
机构:
NEC Corp Ltd, High Frequency Device Res Labs, Tsukuba, Ibaraki 3058501, JapanNEC Corp Ltd, High Frequency Device Res Labs, Tsukuba, Ibaraki 3058501, Japan
Yamada, M
Anan, T
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NEC Corp Ltd, High Frequency Device Res Labs, Tsukuba, Ibaraki 3058501, JapanNEC Corp Ltd, High Frequency Device Res Labs, Tsukuba, Ibaraki 3058501, Japan
Anan, T
Tokutome, K
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机构:
NEC Corp Ltd, High Frequency Device Res Labs, Tsukuba, Ibaraki 3058501, JapanNEC Corp Ltd, High Frequency Device Res Labs, Tsukuba, Ibaraki 3058501, Japan
Tokutome, K
Kamei, A
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机构:
NEC Corp Ltd, High Frequency Device Res Labs, Tsukuba, Ibaraki 3058501, JapanNEC Corp Ltd, High Frequency Device Res Labs, Tsukuba, Ibaraki 3058501, Japan
Kamei, A
Nishi, K
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机构:
NEC Corp Ltd, High Frequency Device Res Labs, Tsukuba, Ibaraki 3058501, JapanNEC Corp Ltd, High Frequency Device Res Labs, Tsukuba, Ibaraki 3058501, Japan
Nishi, K
Sugou, S
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机构:
NEC Corp Ltd, High Frequency Device Res Labs, Tsukuba, Ibaraki 3058501, JapanNEC Corp Ltd, High Frequency Device Res Labs, Tsukuba, Ibaraki 3058501, Japan