The oriented bilateral filtering method for removal of speckle noise in electronic speckle pattern interferometry fringes

被引:0
|
作者
Mingming Chen
Chen Tang
Min Xu
Zhenkun Lei
机构
[1] Tianjin University,School of Electrical and Information Engineering
[2] Dalian University of Technology,State Key Laboratory of Structural Analysis for Industrial Equipment
来源
Applied Physics B | 2019年 / 125卷
关键词
D O I
暂无
中图分类号
学科分类号
摘要
In optical interferometry methods, a challenging problem is how to preserve the edges of all fringes perfectly whilst reducing speckle noise effectively. Directivity is an important characteristic of optical interferometry fringes, and it plays an extremely important role in directing the filtering process. Bilateral filtering is a well-known filtering method for edge-preserving in image processing. In this paper, we propose an oriented bilateral filtering method with special application for optical interferometry fringes by incorporating a directional mask to original bilateral filtering method. We test our oriented bilateral filtering method by applying it to four computer-simulated and one experimentally obtained ESPI fringe patterns, respectively, and compare it with the original bilateral filtering method and the tangent least-squares fitting filtering method. The experimental results demonstrate that the proposed method performs impressively in speckle reduction and fringe edge preservation.
引用
收藏
相关论文
共 50 条
  • [41] Holography and electronic speckle pattern interferometry in geophysics
    Takemoto, S
    OPTICS AND LASERS IN ENGINEERING, 1996, 24 (2-3) : 145 - 160
  • [42] Recent developments in electronic speckle pattern interferometry
    Patorski, K
    12TH CZECH-SLOVAK-POLISH OPTICAL CONFERENCE ON WAVE AND QUANTUM ASPECTS OF CONTEMPORARY OPTICS, 2001, 4356 : 124 - 132
  • [43] LASER APPLICATION FOR ELECTRONIC SPECKLE PATTERN INTERFEROMETRY
    WEBER, J
    F&M-FEINWERKTECHNIK & MESSTECHNIK, 1986, 94 (07): : 426 - 428
  • [44] Electronic speckle pattern interferometry for micromechanical measurements
    Tamulevicius, S
    Augulis, L
    Laukaitis, G
    Zadvydas, M
    ADVANCED ENGINEERING MATERIALS, 2002, 4 (08) : 546 - 550
  • [45] FRINGE CONTRAST IN ELECTRONIC SPECKLE PATTERN INTERFEROMETRY
    WYKES, C
    BUTTERS, JN
    JONES, R
    APPLIED OPTICS, 1981, 20 (05): : A50 - 721
  • [46] ELECTRONIC SPECKLE PATTERN INTERFEROMETRY - TODAY AND TOMORROW
    LOKBERG, OJ
    JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1979, 69 (10) : 1422 - 1422
  • [47] Notes on the application of electronic speckle pattern interferometry
    Ritter, R
    Galanulis, K
    Winter, D
    Muller, E
    Breuckmann, B
    OPTICS AND LASERS IN ENGINEERING, 1997, 26 (4-5) : 283 - 299
  • [48] ELECTRONIC SPECKLE PATTERN INTERFEROMETRY OF THE VIBRATING LARYNX
    GARDNER, GM
    CONERTY, M
    CASTRACANE, J
    PARNES, SM
    ANNALS OF OTOLOGY RHINOLOGY AND LARYNGOLOGY, 1995, 104 (01): : 5 - 12
  • [49] PULSED LASERS IN ELECTRONIC SPECKLE PATTERN INTERFEROMETRY
    COOKSON, TJ
    BUTTERS, JN
    POLLARD, HC
    OPTICS AND LASER TECHNOLOGY, 1978, 10 (03): : 119 - 124
  • [50] The oriented spatial filter masks for electronic speckle pattern interferometry phase patterns
    Tang, Chen
    Gao, Tao
    Yan, Si
    Wang, Linlin
    Wu, Jian
    OPTICS EXPRESS, 2010, 18 (09): : 8942 - 8947