Recent developments in electronic speckle pattern interferometry

被引：0
|
作者：
Patorski, K [1 ]
机构：
[1] Warsaw Univ Technol, Inst Micromech & Photon, PL-02525 Warsaw, Poland
来源：
12TH CZECH-SLOVAK-POLISH OPTICAL CONFERENCE ON WAVE AND QUANTUM ASPECTS OF CONTEMPORARY OPTICS | 2001年 / 4356卷
关键词：
speckle interferometry; ESPI; ESPSI (shearography); lasers; optical fibres; nondestructive testing;
D O I：
10.1117/12.417816
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
Electronic speckle pattern interferometry (ESPI), pioneered 30 years ago, represents one of the most powerful tools for industrial nondestructive testing and metrology. Main advantages include speed of data acquisition and processing, relative simplicity and possibility to work outside the laboratory. Steady progress in optoelectronics, fibre technology and informatics facilitates the development of compact and robust systems for new tasks in engineering analysis.
引用
收藏
页码：124 / 132
页数：9
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