BIST-Based Delay-Fault Testing in FPGAs

被引：0
|
作者：
Miron Abramovici
Charles E. Stroud
机构：
[1] DAFCA,Electrical and Computer Engineering
[2] Auburn University,undefined
来源：
Journal of Electronic Testing | 2003年 / 19卷
关键词：
Built-In Self-Test; Field Programmable Gate Arrays; delay faults;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
We present the first delay-fault testing approach for Field Programmable Gate Arrays (FPGAs), applicable for on-line testing as well as for off-line manufacturing and system-level testing. Our approach is based on Built-In Self-Test (BIST), it is comprehensive, and does not require expensive external test equipment (ATE). We have successfully implemented this BIST approach for delay-fault testing on the Lattice ORCA 2C and Xilinx Spartan FPGAs.
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页码：549 / 558
页数：9
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