BIST-based detection and diagnosis of multiple faults in FPGAs

被引：0

作者：

Abramovici, M ^{[1
]}

Stroud, C ^{[1
]}

机构：

[1] Bell Labs, Lucent Technol, Murray Hill, NJ 07974 USA

来源：

INTERNATIONAL TEST CONFERENCE 2000, PROCEEDINGS | 2000年

关键词：

D O I：

暂无

中图分类号：

TP301 [理论、方法];

学科分类号：

081202 ;

摘要：

We present a BIST-based approach able to detect and accurately diagnose any single and most multiple faulty programmable logic blocks (PLBs) in Field Programmable Gate Arrays (FPGAs). For any faulty PLB, we also identify its internal faulty modules or modes of operation. This accurate diagnosis provides the basis for both failure analysis used for yield improvement and for any repair strategy used for fault-tolerance. We present experimental results showing detection and identification of faulty PLBs in actual defective FPGAs.(1)

引用

页码：785 / 794

页数：10

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