Why RTL ATPG?

被引：0

作者：

Yinghua Min

机构：

[1] The Chinese Academy of Sciences,Institute of Computing Technology

来源：

Journal of Computer Science and Technology | 2002年 / 17卷

关键词：

automatic test generation (ATPG); register transfer level (RTL);

D O I：

暂无

中图分类号：

学科分类号：

摘要：

Register Transfer Level (RTL) Automatic Test Pattern Generation (ATPG) has been of wide concern for two decades. Meanwhile gate-level ATPG has made remarkable progress in dealing with large circuits. An argument is then posed. Do we need RTL ATPG in the case of gate-level ATPG capable of generating tests for large circuits? This paper attempts to answer this question. The necessity, difficulty, and major interests of RTL ATPG are reviewed.

引用

页码：113 / 117

页数：4

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