Ablation experiments on polyimide with femtosecond laser pulses

被引:0
|
作者
S. Baudach
J. Bonse
W. Kautek
机构
[1] Bundesanstalt für Materialforschung und -prüfung,
[2] Laboratorium für Dünnschichttechnologien,undefined
[3] Unter den Eichen 87,undefined
[4] 12205 Berlin,undefined
[5] Germany,undefined
来源
Applied Physics A | 1999年 / 69卷
关键词
PACS: 79.20.D; 61.80.B; 61.82.P;
D O I
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中图分类号
学科分类号
摘要
Some applications of polymer films require the microstructuring of partly uneven substrates. This cannot be achieved by conventional photolithography, usually performed with ultraviolet short-pulse lasers (excimer, fourth harmonic Nd:YAG). When processing thermally sensitive or undoped polymers with low optical absorption, the use of femtosecond laser pulses can improve the ablation precision, also reducing the heat-affected zone. Therefore, a Ti:sapphire laser system was employed to perform ablation experiments on polyimide (PI). The irradiated areas were evaluated by means of optical and scanning electron microscopy. Highly oriented ripple structures, which are related to the polarization state of the laser pulses, were observed in the cavities. The relationship between the ablation threshold fluence and the number of laser pulses applied to the same spot is described in accordance with an incubation model.
引用
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页码:S395 / S398
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