Investigation into the Radiation Hardness of Photodiodes Based on Silicon-on-Sapphire Structures

被引：0
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作者：
Yu. A. Kabalnov
A. N. Trufanov
S. V. Obolensky
机构：
[1] Sedakov Scientific Research Institute of Measurement Systems,
[2] Lobachevsky University of Nizhny Novgorod,undefined
来源：
Semiconductors | 2019年 / 53卷
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页码：368 / 374
页数：6
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