Investigation into the Radiation Hardness of Photodiodes Based on Silicon-on-Sapphire Structures

被引：0

作者：

Yu. A. Kabalnov

A. N. Trufanov

S. V. Obolensky

机构：

[1] Sedakov Scientific Research Institute of Measurement Systems,

[2] Lobachevsky University of Nizhny Novgorod,undefined

来源：

Semiconductors | 2019年 / 53卷

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D O I：

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学科分类号：

摘要：

引用

页码：368 / 374

页数：6

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