Study of Profile Changes during Mechanical Polishing using Relocation Profilometry

被引:1
|
作者
Kumaran S.C. [1 ]
Shunmugam M.S. [1 ]
机构
[1] Department of Mechanical Engineering, Indian Institute of Technology Madras, Chennai
关键词
Mass removal; Mechanical polishing; Profile changes; Relocation profilometry; Surface roughness;
D O I
10.1007/s40032-017-0387-5
中图分类号
学科分类号
摘要
Mechanical polishing is a finishing process practiced conventionally to enhance quality of surface. Surface finish is improved by mechanical cutting action of abrasive particles on work surface. Polishing is complex in nature and research efforts have been focused on understanding the polishing mechanism. Study of changes in profile is a useful method of understanding behavior of the polishing process. Such a study requires tracing same profile at regular process intervals, which is a tedious job. An innovative relocation technique is followed in the present work to study profile changes during mechanical polishing of austenitic stainless steel specimen. Using special locating fixture, micro-indentation mark and cross-correlation technique, the same profile is traced at certain process intervals. Comparison of different parameters of profiles shows the manner in which metal removal takes place in the polishing process. Mass removal during process estimated by the same relocation technique is checked with that obtained using weight measurement. The proposed approach can be extended to other micro/nano finishing processes and favorable process conditions can be identified. © 2017, The Institution of Engineers (India).
引用
收藏
页码:203 / 212
页数:9
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