共 50 条
- [22] TIME-OF-FLIGHT SECONDARY ION MASS-SPECTROMETRY (TOF-SIMS) ANALYSIS OF POLYMER SURFACES - MASS-SPECTRA AND SECONDARY ION IMAGES ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1991, 201 : 81 - COLL
- [23] Biological tissue sample preparation for time-of-flight secondary ion mass spectrometry (ToF-SIMS) imaging NANO CONVERGENCE, 2018, 5
- [25] Concentration of N and P in SiC investigated by time-of-flight secondary ion mass spectrometry (TOF-SIMS) Mater Sci Forum, (453-456):
- [28] STUDIES OF POLYISOBUTYLENE USING TIME-OF-FLIGHT SECONDARY-ION MASS-SPECTROMETRY (TOF-SIMS) INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1995, 143 : 113 - 129
- [29] Concentration of N and P in SIC investigated by time-of-flight secondary ion mass spectrometry (TOF-SIMS) SILICON CARBIDE AND RELATED MATERIALS 2004, 2005, 483 : 453 - 456
- [30] Study on Copper Diffusion Barrier Materials by Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) Proceedings of the 2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), 2016, : 140 - 143