Improvements in graphite-based X-ray mask fabrication for ultradeep X-ray lithography

被引:0
|
作者
R. Divan
D.C. Mancini
S.M. Gallagher
J. Booske
D. Van der Weide
机构
[1] Argonne National Laboratory,Advanced Photon Source
[2] University of Wisconsin,Mechanical Engineering Department
[3] University Wisconsin,Electrical and Computer Engineering Department
来源
Microsystem Technologies | 2004年 / 10卷
关键词
Graphite; Beryllium; Radiation Source; Synchrotron Radiation; Base Layer;
D O I
暂无
中图分类号
学科分类号
摘要
Hard x-ray masks for ultradeep x-ray lithography (UDXRL) at synchrotron radiation sources, such as the Advanced Photon Source, require a gold absorber thickness of 20–100 μm on a low-Z substrate, such as silicon, graphite, or beryllium. Graphite sheets of 0.5 mm were used for the fabrication of x-ray masks by standard optical lithography using a SU-8 photoresist. The conductivity of graphite is sufficient to perform electroplating directly without the need for a metal-plating base layer. Gold electroforming was used to deposit a 85-μm-thick patterned absorber layer. The masks were used for UDXRL using hard x-rays at the Advanced Photon Source.
引用
收藏
页码:728 / 734
页数:6
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