Atomic force and scanning near-field optical microscopy study of carbocyanine dye J-aggregates

被引:1
|
作者
Petrova M.G. [1 ]
Prokhorov V.V. [2 ]
Pozin S.I. [2 ]
Kovaleva N.N. [1 ,3 ]
Demikhov E.I. [1 ]
机构
[1] Lebedev Physical Institute, Russian Academy of Sciences, Moscow
[2] Frumkin Institute of Physical Chemistry and Electrochemistry, Russian Academy of Sciences, Moscow
[3] Institute of Physics, Academy of Sciences of the Czech Republic, Prague
关键词
Optical data storage - Mica - Aggregates - Substrates - Near field scanning optical microscopy;
D O I
10.3103/S1062873814120375
中图分类号
学科分类号
摘要
Atomic force microscopy (AFM) and scanning near-field optical microscopy (SNOM) imaging of fibrillar J-aggregates of carbocyanine dye 3,3′-bis(γ-sulfopropyl)-5,5′,6,6′-tetrachloro-1,1′-dioctylbenzimidacarbocyanine (C8S3) is performed on mica and glass substrates at room temperature. High resolution AFM imaging reveal that thick fibrils consist of narrow sub-fibrils. A model of an elementary fibril with a cross section 3 × 4 nm2 in size is proposed. The SNOM measurements made in the contact mode indicate the high mechanical strength of the fibrillar J-aggregates. © 2014, Allerton Press, Inc.
引用
收藏
页码:1362 / 1366
页数:4
相关论文
共 50 条
  • [31] Polymorphism of Two-Dimensional Cyanine Dye J-Aggregates and Its Genesis: Fluorescence Microscopy and Atomic Force Microscopy Study
    Prokhorov, Valery V.
    Perelygina, Olga M.
    Pozin, Sergey I.
    Mal'tsev, Eugene I.
    Vannikov, Anatoly V.
    JOURNAL OF PHYSICAL CHEMISTRY B, 2015, 119 (48): : 15046 - 15053
  • [32] NEAR-FIELD SCANNING OPTICAL MICROSCOPY
    MORRISON, GH
    ANALYTICAL CHEMISTRY, 1989, 61 (19) : A1075 - A1075
  • [33] Near-field scanning - Optical microscopy
    Shiku, H
    Dunn, RC
    ANALYTICAL CHEMISTRY, 1999, 71 (01) : 23A - 29A
  • [34] SCANNING NEAR-FIELD OPTICAL MICROSCOPY
    HEINZELMANN, H
    POHL, DW
    APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1994, 59 (02): : 89 - 101
  • [35] Near-field scanning optical microscopy
    Buratto, SK
    CURRENT OPINION IN SOLID STATE & MATERIALS SCIENCE, 1996, 1 (04): : 485 - 492
  • [36] SHEAR FORCE MICROSCOPY WITH CAPACITANCE DETECTION FOR NEAR-FIELD SCANNING OPTICAL MICROSCOPY
    LEONG, JK
    WILLIAMS, CC
    APPLIED PHYSICS LETTERS, 1995, 66 (11) : 1432 - 1434
  • [37] Near-field scanning optical microscopy
    Dunn, RC
    CHEMICAL REVIEWS, 1999, 99 (10) : 2891 - +
  • [38] Scanning near-field optical microscopy
    Kirstein, S
    CURRENT OPINION IN COLLOID & INTERFACE SCIENCE, 1999, 4 (04) : 256 - 264
  • [39] Scanning near-field optical microscopy
    Fokas, CS
    NACHRICHTEN AUS CHEMIE TECHNIK UND LABORATORIUM, 1999, 47 (06): : 648 - +
  • [40] Observation of self-assembled fluorescent beads by scanning near-field optical microscopy and atomic force microscopy
    Oh, Y. J.
    Jo, W.
    Kim, Min-Gon
    Park, Hyun Kyu
    Chung, Bong Hyun
    ULTRAMICROSCOPY, 2006, 106 (8-9) : 775 - 778