The Rate of Single Event Upsets in Electronic Circuits onboard Spacecraft

被引：0
|
作者：
N. V. Kuznetsov
机构：
[1] Moscow State University,Skobeltsyn Institute of Nuclear Physics
来源：
Cosmic Research | 2005年 / 43卷
关键词：
Temporal Distribution; Space Station; Experimental Technique; Quantitative Estimate; Single Event;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
Models and methods in use for quantitative estimates of the occurrence of single event upsets in microchips of orbiting spacecraft are considered. A calculation and experimental technique for determining the rate of these effects is described, taking into account spatial and temporal distributions of the fluxes of high-energy particles in the space and their penetration through protective shields. Examples of its application for the orbit of the International Space Station are presented.
引用
收藏
页码：423 / 431
页数：8
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