Testability Trade-Offs for BIST Data Paths

被引：0
|
作者：
Nicola Nicolici
Bashir M. Al-Hashimi
机构：
[1] McMaster University,Computer
[2] University of Southampton,Aided Design and Test Group, Department of Electrical & Computer Engineering
来源：
Journal of Electronic Testing | 2004年 / 20卷
关键词：
BIST; power-constrained test;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
Power dissipation during test application is an emerging problem due to yield and reliability concerns. This paper focuses on BIST for RTL data paths and discusses testability trade-offs in terms of test application time, BIST area overhead and power dissipation.
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收藏
页码：169 / 179
页数：10
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