ASIC TESTABILITY TOOLS FORCE TRADE-OFFS IN SILICON, PERFORMANCE AND COVERAGE

被引：0

作者：

TUCK, B

机构：

来源：

COMPUTER DESIGN | 1992年 / 31卷 / 09期

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D O I：

暂无

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

引用

页码：57 / &

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