Magnetic force microscopy investigation of the magnetization reversal of permalloy particles at high temperatures

被引:0
|
作者
N. I. Nurgazizov
T. F. Khanipov
D. A. Bizyaev
A. A. Bukharaev
A. P. Chuklanov
机构
[1] Kazan Scientific Center of the Russian Academy of Sciences,Zavoisky Physical
[2] Kazan (Volga Region) Federal University,Technical Institute
来源
关键词
External Magnetic Field; Magnetization Reversal; Magnetic Force Microscope; Magnetization Distribution; Switching Field;
D O I
暂无
中图分类号
学科分类号
摘要
The magnetization reversal of an array of permalloy particles formed by scanning probe lithography on the silicon dioxide surface has been investigated in the temperature range from room temperature to 800 K. Using scanning magnetic force microscopy and numerical calculations of the magnetic anisotropy field of a particle at different temperatures, it has been shown that an increase in the temperature leads to a decrease in the external magnetic field required to reverse the magnetization direction of the particle. From the obtained results, it has been concluded that the magnetization reversal of the studied particles is accompanied by the formation of an intermediate state with an inhomogeneous magnetization structure.
引用
收藏
页码:1817 / 1823
页数:6
相关论文
共 50 条
  • [41] Magnetic force microscopy of magnetization reversal of microstructures in situ in the external field of up to 2000Oe
    Bukharaev, AA
    Biziaev, DA
    Borodin, PA
    Ovchinnikov, DA
    [J]. MICRO- AND NANOELECTRONICS 2003, 2004, 5401 : 555 - 560
  • [42] Investigation of Magnetization Distribution in Co/Au Multilayer Film by Magnetic Force Microscopy.
    Nurgazizov, N.
    Zhdan, P.
    Kisielewski, M.
    Stobiecki, F.
    [J]. MAGNETISM AND MAGNETIC MATERIALS, 2009, 152-153 : 277 - +
  • [43] In situ magnetization reversal measurement of magnetic tips in a magnetic force microscope
    Bukaraev, AA
    Biziaev, DA
    Borodin, PA
    Ovchinnikov, DV
    [J]. PHYSICS OF LOW-DIMENSIONAL STRUCTURES, 2004, 1-2 : 153 - 158
  • [44] Study on the magnetization reversal process in a magnetic nanowire and a magnetic dot observed by magnetic field sweeping magnetic force microscopy measurements (invited)
    Endo, Yasushi
    Fujimoto, Hideki
    Kumano, Shinya
    Matsumura, Yusuke
    Sasaki, Isao
    Kawamura, Yoshio
    Yamamoto, Masahiko
    Nakatani, Ryoichi
    [J]. JOURNAL OF APPLIED PHYSICS, 2008, 103 (07)
  • [45] Variable magnetic field magnetic force microscopy of the magnetization reversal in epitaxial iron (1 1 1) thin films
    Foss, S
    Merton, C
    Proksch, R
    Skidmore, G
    Schmidt, J
    Dahlberg, ED
    Pokhil, T
    Cheng, YT
    [J]. JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, 1998, 190 (1-2) : 60 - 70
  • [46] Magnetic elements for switching magnetization magnetic force microscopy tips
    Cambel, V.
    Elias, P.
    Gregusova, D.
    Martaus, J.
    Fedor, J.
    Karapetrov, G.
    Novosad, V.
    [J]. JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, 2010, 322 (18) : 2715 - 2721
  • [47] Magnetization reversal process of the nanosized elliptical permalloy magnetic dots with various aspect ratios
    Lee, JH
    Oh, KW
    Kim, HJ
    Kim, KY
    [J]. JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, 2004, 272 : 736 - 737
  • [48] Magnetic force microscopy study in patterned permalloy submicron-wires
    Huang, E. W.
    Yu, C.
    Lee, S. F.
    Yao, Y. D.
    Chen, T. Y.
    Wong, M. S.
    Chang, C. R.
    Han, B. S.
    Ma, Y. R.
    [J]. International Journal of Nanoscience, Vol 2, Nos 4 and 5, 2003, 2 (4-5): : 325 - 333
  • [49] Non-contact magnetic force microscopy of recording media by ex situ tip magnetization reversal method
    Zhong, Hai
    Peng, Wei
    Tarrach, Guido
    Drechsler, Andreas
    Jiang, Jun
    Wei, Dan
    Yuan, Jun
    [J]. JOURNAL OF PHYSICS D-APPLIED PHYSICS, 2008, 41 (08)
  • [50] Dot-by-dot analysis of magnetization reversal in perpendicular patterned CoCrPt medium by using magnetic force microscopy
    Bai, J
    Takahoshi, H
    Ito, H
    Saito, H
    Ishio, S
    [J]. JOURNAL OF APPLIED PHYSICS, 2004, 96 (02) : 1133 - 1137