Dot-by-dot analysis of magnetization reversal in perpendicular patterned CoCrPt medium by using magnetic force microscopy

A dot-by-dot analysis to investigate the magnetization switching behavior of the perpendicular patterned CoCrPt medium is reported. The medium is investigated by in situ and ex situ magnetic force microscopy (MFM) techniques. The topographical and magnetic characteristics of each magnetic dot were studied in given areas. The perpendicular dc demagnetization (DCD) remanence data evaluated by counting the volume of reversed magnetic dots according to the ex situ MFM measurements were in good agreement with alternating gradient magnetometry measurements. The influence of the magnetostatic energy associated with nanodots to the distribution of the intrinsic coercivity of individual magnetic dots and the intrinsic DCD curve of the medium are estimated. Further, the mechanism of magnetization reversal of individual magnetic dot is discussed. (C) 2004 American Institute of Physics.