Tape edge wear and its relationship to lateral tape motion

被引：0
|
作者：
Jason H. Wang
Frank E. Talke
机构：
[1] University of California at San Diego,Department of Mechanical and Aerospace Engineering
来源：
Microsystem Technologies | 2005年 / 11卷
关键词：
Magnetic tape; Tape edge wear; AFM and lateral tape motion;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
The relationship between tape edge wear and lateral tape displacement is investigated for a typical 12.7 mm (1/2 inch) tape drive. Tape edge wear is measured using atomic force microscopy, while lateral tape displacement is measured using an optical edge sensor. The lateral displacement signal is high-pass and band-pass filtered to examine the effect of tape edge wear on the dynamics of lateral tape displacement. In addition, time frequency analysis of the lateral displacement signal is performed.
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页码：1158 / 1165
页数：7
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