Tape edge wear and its relationship to lateral tape motion

被引：0
|
作者：
Jason H. Wang
Frank E. Talke
机构：
[1] University of California at San Diego,Department of Mechanical and Aerospace Engineering
来源：
Microsystem Technologies | 2005年 / 11卷
关键词：
Magnetic tape; Tape edge wear; AFM and lateral tape motion;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
The relationship between tape edge wear and lateral tape displacement is investigated for a typical 12.7 mm (1/2 inch) tape drive. Tape edge wear is measured using atomic force microscopy, while lateral tape displacement is measured using an optical edge sensor. The lateral displacement signal is high-pass and band-pass filtered to examine the effect of tape edge wear on the dynamics of lateral tape displacement. In addition, time frequency analysis of the lateral displacement signal is performed.
引用
收藏
页码：1158 / 1165
页数：7
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