Manufacturing intelligence to forecast and reduce semiconductor cycle time

被引:0
|
作者
Chen-Fu Chien
Chia-Yu Hsu
Chih-Wei Hsiao
机构
[1] National Tsing Hua University,Department of Industrial Engineering and Engineering Management
[2] Yuan Ze University,Department of Information Management
来源
关键词
Cycle time; Work in process (WIP); Manufacturing intelligence; Gauss-Newton regression; Back-propagation neural network; Semiconductor;
D O I
暂无
中图分类号
学科分类号
摘要
Semiconductor manufacturing is one of the most complicated production processes with the challenges of dynamic job arrival, job re-circulation, shifting bottlenecks, and lengthy fabrication process. Owing to the lengthy wafer fabrication process, work in process (WIP) usually affects the cycle time and throughput in the semiconductor fabrication. As the applications of semiconductor have reached the era of consumer electronics, time to market has played an increasingly critical role in maintaining a competitive advantage for a semiconductor company. Many past studies have explored how to reduce the time of scheduling and dispatching in the production cycle. Focusing on real settings, this study aims to develop a manufacturing intelligence approach by integrating Gauss-Newton regression method and back-propagation neural network as basic model to forecast the cycle time of the production line, where WIP, capacity, utilization, average layers, and throughput are rendered as input factors for indentifying effective rules to control the levels of the corresponding factors as well as reduce the cycle time. Additionally, it develops an adaptive model for rapid response to change of production line status. To evaluate the validity of this approach, we conducted an empirical study on the demand change and production dynamics in a semiconductor foundry in Hsinchu Science Park. The approach proved to be successful in improving forecast accuracy and realigning the desired levels of throughput in production lines to reduce the cycle time.
引用
收藏
页码:2281 / 2294
页数:13
相关论文
共 50 条
  • [1] Manufacturing intelligence to forecast and reduce semiconductor cycle time
    Chien, Chen-Fu
    Hsu, Chia-Yu
    Hsiao, Chih-Wei
    JOURNAL OF INTELLIGENT MANUFACTURING, 2012, 23 (06) : 2281 - 2294
  • [2] Manufacturing intelligence for semiconductor demand forecast based on technology diffusion and product life cycle
    Chien, Chen-Fu
    Chen, Yun-Ju
    Peng, Jin-Tang
    INTERNATIONAL JOURNAL OF PRODUCTION ECONOMICS, 2010, 128 (02) : 496 - 509
  • [3] Reduce Cycle Time at Semiconductor Assembly Test Manufacturing withFactory Physics Methodology
    Fei, Xiong
    Jin, Yao
    MATERIALS PROCESSING AND MANUFACTURING III, PTS 1-4, 2013, 753-755 : 3166 - +
  • [4] Manufacturing Intelligence to Exploit the Value of Production and Tool Data to Reduce Cycle Time
    Kuo, Chung-Jen
    Chien, Chen-Fu
    Chen, Jan-Daw
    IEEE TRANSACTIONS ON AUTOMATION SCIENCE AND ENGINEERING, 2011, 8 (01) : 103 - 111
  • [5] Semiconductor Manufacturing Intelligence and Key Factor Control Mechanism for Managing Production Cycle Time
    Chien, Chen-Fu
    Huang, Hung-Ya
    Chang, Kuo-Hao
    Lin, Yu-Cheng
    Liu, Tien-Hsian
    2011 INTERNATIONAL SYMPOSIUM ON SEMICONDUCTOR MANUFACTURING (ISSM) AND E-MANUFACTURING AND DESIGN COLLABORATION SYMPOSIUM (EMDC), 2011,
  • [6] EFFICIENT SCHEDULING POLICIES TO REDUCE MEAN AND VARIANCE OF CYCLE-TIME IN SEMICONDUCTOR MANUFACTURING PLANTS
    LU, SCH
    RAMASWAMY, D
    KUMAR, PR
    IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, 1994, 7 (03) : 374 - 388
  • [7] Automation: Key to Cycle Time Improvement in Semiconductor Manufacturing
    Sonar, Amit
    Shinde, Satyajit
    Teh, Susanto
    2013 24TH ANNUAL SEMI ADVANCED SEMICONDUCTOR MANUFACTURING CONFERENCE (ASMC), 2013, : 93 - 98
  • [8] Excursion Yield Loss and Cycle Time Reduction in Semiconductor Manufacturing
    Leachman, Robert C.
    Ding, Shengwei
    IEEE TRANSACTIONS ON AUTOMATION SCIENCE AND ENGINEERING, 2011, 8 (01) : 112 - 117
  • [9] Technique to Improve Visibility for Cycle Time Improvement in Semiconductor Manufacturing
    Ab Rahim, Syahril Ridzuan
    Ahmad, Ibrahim
    Chik, Mohd Azizi
    2012 10TH IEEE INTERNATIONAL CONFERENCE ON SEMICONDUCTOR ELECTRONICS (ICSE), 2012, : 627 - 630
  • [10] A METHOD FOR CYCLE TIME ESTIMATION OF SEMICONDUCTOR MANUFACTURING TOOLSETS WITH CORRELATIONS
    Akhavan-Tabatabaei, Raba
    Ding, Shengwei
    Shanthikumar, J. George
    PROCEEDINGS OF THE 2009 WINTER SIMULATION CONFERENCE (WSC 2009 ), VOL 1-4, 2009, : 1686 - +