An improved theoretical model of the dc characteristics of metal-semiconductor field effect transistors

被引:0
|
作者
P. Chattopadhyay
J. Pal
机构
[1] Department of Electronic Science,
[2] University College of Science,undefined
[3] 92,undefined
[4] A.P.C. Road,undefined
[5] Calcutta-700 009,undefined
[6] India,undefined
来源
Applied Physics A | 1998年 / 67卷
关键词
PACS: 73.20; 73.30+y; 73.40.Qv;
D O I
暂无
中图分类号
学科分类号
摘要
引用
收藏
页码:563 / 565
页数:2
相关论文
共 50 条
  • [31] Photoionization spectroscopy of traps in GaN metal-semiconductor field-effect transistors
    Klein, PB
    Binari, SC
    Freitas, JA
    Wickenden, AE
    JOURNAL OF APPLIED PHYSICS, 2000, 88 (05) : 2843 - 2852
  • [32] METAL-SEMICONDUCTOR RECTIFIERS AND TRANSISTORS
    GOSSICK, BR
    SOLID-STATE ELECTRONICS, 1963, 6 (05) : 445 - 452
  • [33] Effect of deep-level impurities on the drain characteristics of short-channel metal-semiconductor field effect transistors
    Chattopadhyay, P
    Majumdar, L
    SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 1998, 13 (02) : 226 - 230
  • [34] Metal-Semiconductor Barrier Modulation for High Photoresponse in Transition Metal Dichalcogenide Field Effect Transistors
    Hua-Min Li
    Dae-Yeong Lee
    Min Sup Choi
    Deshun Qu
    Xiaochi Liu
    Chang-Ho Ra
    Won Jong Yoo
    Scientific Reports, 4
  • [35] Low-power MoS2 metal-semiconductor field effect transistors (MESFETs) based on standard metal-semiconductor contact
    Yang, Chengzhi
    Jiang, Cheng
    Niu, Wencheng
    Hao, Dandan
    Huang, Hao
    Fu, Houqiang
    Miao, Jinshui
    Liu, Xingqiang
    Zou, Xuming
    Shan, Fukai
    Yang, Zhenyu
    APPLIED PHYSICS LETTERS, 2024, 124 (07)
  • [36] Metal-Semiconductor Barrier Modulation for High Photoresponse in Transition Metal Dichalcogenide Field Effect Transistors
    Li, Hua-Min
    Lee, Dae-Yeong
    Choi, Min Sup
    Qu, Deshun
    Liu, Xiaochi
    Ra, Chang-Ho
    Yoo, Won Jong
    SCIENTIFIC REPORTS, 2014, 4
  • [37] Investigations of Surface State and 1/fr Noise Characteristics of InGaAs Metal-Semiconductor Field-Effect Transistors
    Tsai, Han-Chang
    Wang, Kuo-Chang
    JAPANESE JOURNAL OF APPLIED PHYSICS, 2009, 48 (07)
  • [38] Improved analytical model for threshold behavior of sidegating effect in GaAs metal-semiconductor field-effect transistors induced by impact ionization of deep traps
    Zhao, FC
    Xia, GQ
    Du, LX
    Tan, HZ
    JOURNAL OF APPLIED PHYSICS, 1999, 85 (01) : 604 - 607
  • [39] Electrically isolated metal-semiconductor field effect transistors and logic circuits on homoepitaxial diamonds
    Kawarada, H.
    Itoh, M.
    Hokazono, A.
    Japanese Journal of Applied Physics, Part 2: Letters, 1996, 35 (9 B):
  • [40] INSTABILITY AND GATE VOLTAGE NOISE IN GAAS METAL-SEMICONDUCTOR FIELD-EFFECT TRANSISTORS
    DAY, DJ
    TRUDEAU, M
    MCALISTER, SP
    HURD, CM
    CANADIAN JOURNAL OF PHYSICS, 1989, 67 (04) : 238 - 241