X-ray Laue diffraction with allowance for two-dimensional curvature of the wavefront: The concept a locally plane wave

被引:0
|
作者
M. K. Balyan
机构
[1] Yerevan State University,
来源
Journal of Contemporary Physics (Armenian Academy of Sciences) | 2014年 / 49卷
关键词
Laue diffraction; locally plane wave; curvature of the wavefront;
D O I
暂无
中图分类号
学科分类号
摘要
Symmetrical Laue diffraction in a perfect crystal with a plane entance surface is considered. The two dimensional curvature of the wave front of the incident beam is taken into account. Using the corresponding Green function, a general expression for the amplitude of diffracted wave in the crystal is presented. Based on this expression, the concept of a locally plane wave is analyzed taking into account two-dimensional curvature of the wave front. This concept is used for obtaining the rocking curves depending on the angles of deviation from the chosen exact Bragg direction in both the diffraction plane and in perpendicular direction. The obtained result is compared with the result of the standard dynamical diffraction theory.
引用
收藏
页码:301 / 304
页数:3
相关论文
共 50 条
  • [21] Recent advances in two-dimensional X-ray diffraction
    He, Bob
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2017, 253
  • [22] Recent Advances in Two-dimensional X-ray Diffraction
    He, Bob
    ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 2011, 67 : C670 - C670
  • [23] Stress measurement with two-dimensional X-ray diffraction
    He, BB
    THIRD INTERNATIONAL CONFERENCE ON EXPERIMENTAL MECHANICS, 2002, 4537 : 127 - 130
  • [24] Powder x-ray diffraction of two-dimensional materials
    Yang, D
    Frindt, RF
    JOURNAL OF APPLIED PHYSICS, 1996, 79 (05) : 2376 - 2385
  • [25] X-ray wavefront characterization with two-dimensional wavefront sensors: shearing interferometers and Hartmann wavefront sensors
    Baker, Kevin L.
    OPTICAL ENGINEERING, 2013, 52 (02)
  • [26] X-Ray Wavefront Characterization with Two-Dimensional Wavefront Sensors: Shearing Interferometers and Hartmann Wavefront Sensors
    Baker, Kevin L.
    ADAPTIVE X-RAY OPTICS II, 2012, 8503
  • [27] X-ray μ-Laue diffraction analysis of Cu through-silicon vias: A two-dimensional and three-dimensional study
    Sanchez, Dario Ferreira
    Laloum, David
    Weleguela, Monica Larissa Djomeni
    Ulrich, Olivier
    Audoit, Guillaume
    Grenier, Adeline
    Micha, Jean-Sebastien
    Robach, Odile
    Lorut, Frederic
    Gergaud, Patrice
    Bleuet, Pierre
    JOURNAL OF APPLIED PHYSICS, 2014, 116 (16)
  • [28] In-plane lattice strain evaluation in piezoelectric microcantilever by two-dimensional X-ray diffraction
    Morioka, Hitoshi
    Saito, Keisuke
    Kobayashi, Takeshi
    Kurosawa, Toshiyuki
    Funakubo, Hiroshi
    Japanese Journal of Applied Physics, 2008, 47 (9 PART 2): : 7537 - 7540
  • [29] In-plane lattice strain evaluation in piezoelectric microcantilever by two-dimensional X-ray diffraction
    Morioka, Hitoshi
    Saito, Keisuke
    Kobayashi, Takeshi
    Kurosawa, Toshiyuki
    Funakubo, Hiroshi
    JAPANESE JOURNAL OF APPLIED PHYSICS, 2008, 47 (09) : 7537 - 7540
  • [30] Stress and texture analysis with two-dimensional x-ray diffraction
    He, BB
    Preckwinkel, U
    Smith, KL
    ECRS 6: PROCEEDINGS OF THE 6TH EUROPEAN CONFERENCE ON RESIDUAL STRESSES, 2002, 404-7 : 109 - 114