Stress measurement with two-dimensional X-ray diffraction

Two-dimensional diffraction systems, when used for residual stress measurement, have many advantages over the conventional one-dimensional diffraction systems in dealing with highly textured materials, large grain size, small sample area, and weak diffraction. The stress measurement is based on the fundamental relationship between the stress tensor and the diffraction cone distortion. The benefit of the 2D method is that all the data points on diffraction rings are used to calculate stresses so as to get better measurement result with less data collection time. The present paper introduces the recent development in the theory and applications of stress measurement using 2D detectors.