Calibration of CCD detector after damage

被引：0
|
作者：
A. P. Dudka
机构：
[1] Russian Academy of Sciences,Shubnikov Institute of Crystallography
来源：
Crystallography Reports | 2015年 / 60卷
关键词：
Sapphire; Crystallography Report; Reliability Factor; Identical Reflection; Langasite Family;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
An Xcalibur X-ray diffractometer with a Sapphire 3 CCD detector (Rigaku Oxford Diffraction) has been calibrated to remove damage effects. Visual proof of the validity of the detector calibration map is obtained for the first time. The calibration has significantly improved the reliability of the structural data on Ba3TaFe3Si2O14 single crystal.
引用
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页码：984 / 985
页数：1
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