Two-terminal spin–orbit torque magnetoresistive random access memory

被引:1
|
作者
Noriyuki Sato
Fen Xue
Robert M. White
Chong Bi
Shan X. Wang
机构
[1] Stanford University,Department of Electrical Engineering
[2] Tsinghua University,Department of Electrical Engineering
[3] Stanford University,Department of Material Science and Engineering
来源
Nature Electronics | 2018年 / 1卷
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摘要
Spin-transfer torque magnetoresistive random access memory (STT-MRAM) is an attractive alternative to existing random access memory technologies due to its non-volatility, fast operation and high endurance. However, STT-MRAM does have limitations, including the stochastic nature of the STT-switching and a high critical switching current, which makes it unsuitable for ultrafast operation in the nanosecond and subnanosecond regimes. Spin–orbit torque (SOT) switching, which relies on the torque generated by an in-plane current, has the potential to overcome these limitations. However, SOT-MRAM cells studied so far use a three-terminal structure to apply the in-plane current, which increases the size of the cells. Here we report a two-terminal SOT-MRAM cell based on a CoFeB/MgO magnetic tunnel junction pillar on an ultrathin and narrow Ta underlayer. In this device, in-plane and out-of-plane currents are simultaneously generated on application of a voltage, and we demonstrate that the switching mechanism is dominated by SOT.
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页码:508 / 511
页数:3
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