In situ mechanical observations during nanoindentation inside a high-resolution scanning electron microscope

被引:0
|
作者
K.A. Rzepiejewska-Malyska
G. Buerki
J. Michler
R.C. Major
E. Cyrankowski
S.A.S. Asif
O.L. Warren
机构
[1] Swiss Federal Laboratories for Material Testing and Research—EMPA,
[2] Hysitron,undefined
[3] Inc.,undefined
来源
关键词
D O I
暂无
中图分类号
学科分类号
摘要
In nanoindentation, the occurrence of cracks, pileup, sink-in, or film delamination adds additional complexity to the analysis of the load–displacement curves. Many techniques and analysis methods have been used to extract both qualitative and quantitative information from the indentation test both during and after the test. Much of this information is obtained indirectly or may even be overlooked by current testing methods (e.g., cracks that open only during the loading cycle of the test may go unnoticed from a typical residual indentation analysis). Here we report on the development of a miniature depth-sensing nanoindentation instrument and its integration into a high-resolution scanning electron microscope. Real-time observation of the nanoindentation test via scanning electron microscopy allows for visualization and detection of certain events such as crack initiation, pileup, or sink-in, and other material deformation phenomena. Initial results from aluminum 〈100〉 and a thin gold film (∼225 nm) are presented.
引用
收藏
页码:1973 / 1979
页数:6
相关论文
共 50 条
  • [1] In situ mechanical observations during nanoindentation inside a high-resolution scanning electron microscope
    Swiss Federal Laboratories for Material Testing and Research, EMPA, CH-3602 Thun, Switzerland
    不详
    J Mater Res, 2008, 7 (1973-1979):
  • [2] In situ mechanical observations during nanoindentation inside a high-resolution scanning electron microscope
    Rzepiejewska-Malyska, K. A.
    Buerki, G.
    Michler, J.
    Major, R. C.
    Cyrankowski, E.
    Asif, S. A. S.
    Warren, O. L.
    JOURNAL OF MATERIALS RESEARCH, 2008, 23 (07) : 1973 - 1979
  • [3] A novel and compact nanoindentation device for in situ nanoindentation tests inside the scanning electron microscope
    Huang, Hu
    Zhao, Hongwei
    Mi, Jie
    Yang, Jie
    Wan, Shunguang
    Xu, Lixia
    Ma, Zhichao
    AIP ADVANCES, 2012, 2 (01):
  • [4] HIGH-RESOLUTION SCANNING ELECTRON MICROSCOPE
    CREWE, AV
    SCIENTIFIC AMERICAN, 1971, 224 (04) : 26 - &
  • [5] A HIGH-RESOLUTION SCANNING TRANSMISSION ELECTRON MICROSCOPE
    CREWE, AV
    WALL, J
    WELTER, LM
    JOURNAL OF APPLIED PHYSICS, 1968, 39 (13) : 5861 - &
  • [6] HIGH-RESOLUTION SCANNING ELECTRON-MICROSCOPE
    KOIKE, H
    JOURNAL OF ELECTRON MICROSCOPY, 1983, 32 (01): : 67 - 67
  • [7] HIGH-RESOLUTION TV SCANNING ELECTRON-MICROSCOPE
    SAKITANI, Y
    OTAKA, T
    JOURNAL OF ELECTRON MICROSCOPY, 1976, 25 (03): : 190 - 190
  • [8] IMMUNOCYTOCHEMISTRY WITH HIGH-RESOLUTION SCANNING ELECTRON-MICROSCOPE
    TANAKA, K
    JOURNAL OF HISTOCHEMISTRY & CYTOCHEMISTRY, 1990, 38 (07) : 1057 - 1057
  • [9] DISLOCATION IMAGES IN HIGH-RESOLUTION SCANNING ELECTRON-MICROSCOPE
    STERN, RM
    TAKASHIMA, S
    HASHIMOTO, H
    KIMOTO, S
    ICHINOKAWA, T
    PHILOSOPHICAL MAGAZINE, 1972, 26 (06) : 1495 - +
  • [10] CONTRAST IN HIGH-RESOLUTION SCANNING ELECTRON-MICROSCOPE IMAGES
    JOY, DC
    JOURNAL OF MICROSCOPY-OXFORD, 1991, 161 : 343 - 355