Digital Signature Proposal for Mixed-Signal Circuits

被引:0
|
作者
Anna Maria Brosa
Joan Figueras
机构
[1] Infineon Technologies AG,Mixed
[2] Universitat Politècnica de Catalunya,Signal Wireline Transceivers
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关键词
analog test; mixed-signal test; BIST;
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学科分类号
摘要
A new Built-In Self-Test structure, based on the information provided by the XY-operation (Lissajous curves) is introduced in this paper. A Digital Signature is obtained which is used to discriminate catastrophic as well as parametric defects. High Fault Coverage is achieved when applying the proposed BIST on an ITC'97 benchmark circuit where 92% of the catastrophic defects and 87.5% of the parametric defects analyzed produced digital signatures clearly distinguishable from the golden signature.
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页码:385 / 393
页数:8
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