Revealing nano-scale lattice distortions in implanted material with 3D Bragg ptychography

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作者
Peng Li
Nicholas W. Phillips
Steven Leake
Marc Allain
Felix Hofmann
Virginie Chamard
机构
[1] Aix-Marseille Univ,Department of Engineering Science
[2] CNRS,undefined
[3] Centrale Marseille,undefined
[4] Institut Fresnel,undefined
[5] University of Oxford,undefined
[6] ESRF – The European Synchrotron,undefined
[7] Diamond Light Source,undefined
[8] Harwell Science and Innovation Campus,undefined
[9] Paul Scherrer Institut,undefined
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摘要
Small ion-irradiation-induced defects can dramatically alter material properties and speed up degradation. Unfortunately, most of the defects irradiation creates are below the visibility limit of state-of-the-art microscopy. As such, our understanding of their impact is largely based on simulations with major unknowns. Here we present an x-ray crystalline microscopy approach, able to image with high sensitivity, nano-scale 3D resolution and extended field of view, the lattice strains and tilts in crystalline materials. Using this enhanced Bragg ptychography tool, we study the damage helium-ion-irradiation produces in tungsten, revealing a series of crystalline details in the 3D sample. Our results lead to the conclusions that few-atom-large ‘invisible’ defects are likely isotropic in orientation and homogeneously distributed. A partially defect-denuded region is observed close to a grain boundary. These findings open up exciting perspectives for the modelling of irradiation damage and the detailed analysis of crystalline properties in complex materials.
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