A Three-Stage Coarse-Fine-Tuning Analog-Assisted Digital LDO

被引:0
|
作者
Liu, Lianxi [1 ]
Chen, Yiwei [1 ]
Liao, Xufeng [1 ]
Mu, Junchao [1 ]
Yang, Yintang [1 ]
机构
[1] Xidian Univ, Sch Microelect, Shaanxi Key Lab Integrated Circuits & Syst, Xian 710071, Peoples R China
基金
中国国家自然科学基金;
关键词
Digital low dropout regulator; analog-assisted; three-stage; coarse-fine-tuning; transient response; REGULATOR;
D O I
10.1142/S021812662150047X
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
This paper proposes a three-stage coarse-fine-tuning analog-assisted digital low dropout regulator (AAD-LDO) without digital ripple. The digital regulation consists of two stages, which break the accuracy-speed-power trade-off. To further improve transient response, a step-variable counter used in the first stage is designed, which makes sure that the output current can track the load current rapidly. The ripple caused by the digital regulation disappears due to the existence of the analog-assistant stage (in the proposed AAD-LDO). As a result, the AAD-LDO achieves the output voltage with high accuracy. Designed in a 0.18 mu m CMOS process, the proposed AAD-LDO has a layout area of 0.133mm. For the input range of 1.2-1.8V, the output voltage is 1V. The maximum load current is 10mA at the input voltage of 1.2V. The linear regulation and load regulation are 0.061mV/V and 0.0082mV/mA, respectively. The over/undershoot is suppressed effectively for a 9.5mA load step. The peak current efficiency is 99.78%.
引用
收藏
页数:23
相关论文
共 50 条
  • [1] A Fully Integrated Digital LDO With Coarse-Fine-Tuning and Burst-Mode Operation
    Huang, Mo
    Lu, Yan
    Sin, Sai-Weng
    Seng-Pan, U.
    Martins, Rui P.
    IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS, 2016, 63 (07) : 683 - 687
  • [2] An Analog-Assisted Digital LDO With Dynamic-Biasing Asynchronous Comparator
    Woo, Yuet Ho
    Yang, Jianxin
    Li, Junwen
    Guo, Jianping
    Zheng, Yanqi
    Leung, Ka Nang
    IEEE ACCESS, 2022, 10 : 56996 - 57002
  • [3] Digital LDO with Analog-Assisted Dynamic Reference Correction for Fast and Accurate Load Regulation
    Lahiri, Abhirup
    Bansal, Shrestha
    Bansal, Nitin
    Hashmi, Mohammad S.
    2017 IEEE 60TH INTERNATIONAL MIDWEST SYMPOSIUM ON CIRCUITS AND SYSTEMS (MWSCAS), 2017, : 767 - 770
  • [4] An NMOS Digital LDO With NAND-Based Analog-Assisted Loop in 28-nm CMOS
    Ma, Xiaofei
    Lu, Yan
    Li, Qiang
    Ki, Wing-Hung
    Martins, Rui P.
    IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS, 2020, 67 (11) : 4041 - 4052
  • [5] An Analog-Assisted Digital LDO With Single Subthreshold Output pMOS Achieving 1.44-fs FOM
    Xu, Li
    Choo, Kyojin
    Blaauw, David
    Sylvester, Dennis
    IEEE SOLID-STATE CIRCUITS LETTERS, 2021, 4 : 154 - 157
  • [6] A 0.6 V Fast-Transient-Response 180 nm CMOS Digital LDO with Coarse-Fine Tuning and Analog Enhancement
    Kaiqiang Zhang
    Xingyuan Tong
    Circuits, Systems, and Signal Processing, 2022, 41 : 6513 - 6529
  • [7] A 0.6 V Fast-Transient-Response 180 nm CMOS Digital LDO with Coarse-Fine Tuning and Analog Enhancement
    Zhang, Kaiqiang
    Tong, Xingyuan
    CIRCUITS SYSTEMS AND SIGNAL PROCESSING, 2022, 41 (11) : 6513 - 6529
  • [8] An Analog-assisted Fast-transient Digital LDO with a Charge-pump-based Fine Loop Achieving 0.14-mV Output Voltage Ripples
    Qaisar, Shirin
    Akram, Muhammad Abrar
    Farooq, Muhammad Haris
    Kweon, Soon-Jae
    Cheema, Hammad M.
    Ha, Sohmyung
    2024 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS, ISCAS 2024, 2024,
  • [9] A Single-Controller-Four-Output Analog-Assisted Digital LDO with Adaptive-Time-Multiplexing Control in 65-nm CMOS
    Lu, Yasu
    Chen, Feng
    Mok, Philip K. T.
    IEEE 45TH EUROPEAN SOLID STATE CIRCUITS CONFERENCE (ESSCIRC 2019), 2019, : 289 - 292
  • [10] Automated Bone Age Assessment: A New Three-Stage Assessment Method from Coarse to Fine
    Xu, Xinzheng
    Xu, Huihui
    Li, Zhongnian
    HEALTHCARE, 2022, 10 (11)