Quantitative time-of-flight secondary ion mass spectrometry for the characterization of multicomponent adsorbed protein films

被引：22
|
作者：
Wagner, MS
Shen, M
Horbett, TA
Castner, DG
机构：
[1] Univ Washington, Dept Chem Engn, Seattle, WA 98195 USA
[2] Univ Washington, Dept Bioengn, Seattle, WA 98195 USA
来源：
APPLIED SURFACE SCIENCE | 2003年 / 203卷
关键词：
ToF-SIMS; protein adsorption; multivariate analysis; multicomponent;
D O I：
10.1016/S0169-4332(02)00795-X
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is ideal for the characterization of adsorbed proteins due to its chemical specificity and surface sensitivity. We have employed ToF-SIMS and multivariate analysis to determine the surface composition of adsorbed protein films from binary mixtures, blood serum, and blood plasma. Good correlation between ToF-SIMS data and independent radiolabeling studies was achieved for binary mixtures, though these results depended on the substrate. Qualitative insight into the composition of the serum and plasma protein films was obtained via comparison to standard single protein film spectra. ToF-SIMS and multivariate analysis were able to measure the surface composition of multicomponent adsorbed protein films. (C) 2002 Elsevier Science B.V. All rights reserved.
引用
收藏
页码：704 / 709
页数：6
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