Organic microanalysis by time-of-flight secondary ion mass spectrometry

被引：0
|
作者：
Sjovall, Peter [1 ]
机构：
[1] SP Tech Res Inst Sweden, SE-50115 Boras, Sweden
来源：
GEOCHIMICA ET COSMOCHIMICA ACTA | 2007年 / 71卷 / 15期
关键词：
D O I：
暂无
中图分类号：
P3 [地球物理学]; P59 [地球化学];
学科分类号：
0708 ; 070902 ;
摘要：
引用
收藏
页码：A944 / A944
页数：1
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