Effects of sputtering power on properties of PbSe nanocrystalline thin films deposited by RF magnetron sputtering

被引：19
|
作者：
Feng, Wenran [1 ]
Wang, Xiaoyang [2 ]
Zhou, Hai [1 ]
Chen, Fei [1 ]
机构：
[1] Beijing Inst Petrochem Technol, Coll Mat Sci & Engn, Beijing 102617, Peoples R China
[2] Beijing Univ Chem Technol, Coll Mat Sci & Engn, Beijing 100029, Peoples R China
来源：
VACUUM | 2014年 / 109卷
基金：
北京市自然科学基金;
关键词：
PbSe; Thin films; Nanocrystalline; Sputtering power; ELECTRICAL-PROPERTIES; OPTICAL-CONSTANTS; NANOWIRES; GROWTH; ARRAYS;
D O I：
10.1016/j.vacuum.2014.07.012
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
PbSe nanocrystalline films were prepared by radio frequency (RF) magnetron sputtering with different powers ranging from 40 to 100 W. The impact of RF power on the crystal structure, surface morphology, and optical properties of the as-deposited films were investigated. Results show that the film demonstrates typical preferred orientation in (200) orientation. And the intensity for all diffraction peaks is enhanced with increasing sputtering power. The grains are equiaxial sphere under lower power, which turns to regular cubic-shaped ones under higher power. The calculated optical band gap of the ails lies between 1.26 and 2.02 eV. This broader band gap suggests an important potential application in solar cells. (C) 2014 Elsevier Ltd. All rights reserved.
引用
收藏
页码：108 / 111
页数：4
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